Reliability Training Course: Data analysis and reporting

Day One:

I. Introduction

A. History of electronics and reliability
B. Basic Definitions

1.Yield, Quality and Reliability
2.Lifetime, Failure, Degradation and Failure Criterion
3.Percentiles

C. Lifetime models
D. Acceleration Factors
E. Failure time distributions
F. Prediction <-> Confidence Intervals
G. Overview of standards

Lunch

II. Least square fitting (LSE)

A. Basics
B. Formulas
C. Software packages
D. Error calculations
E. Examples and exercises

Day Two:

III. Maximum likelihood fitting (MLE)

A. Basics
B. Formulas
C. Software packages
D. Error calculations
E. Examples and exercises

Lunch

IV. LSE <-> MLE, confidence intervals, multiple fitting and correlation items

A. PRO’s and CON’s of LSE
B. PRO’s and CON’s of MLE
C. Confidence interval calculations
D. Prediction interval calculations
E. Fitting distribution and lifetime model together
F. How to properly correlate data?

Trainer : Kristof Croes

Courses

Reliability Training Course:
-Data analysis and reporting

Wafer Level Reliability

Package Level Reliability

ESD and Latch-Up