Keithley S630

• Measure low currents, voltages, and capacitances quickly and accurately make it ideal monitoring critical parameters such as gate oxide integrity, FLASH lifetime, and DRAM refresh time.
• Capabilities:
  Current: 100pA(100aA res.) to 1A(1 µA res.), basic accuracy 0.04%
  Voltage: 200mV(100nV res.) to 200V(100µV res.), basic accuracy 0.02%
  Voltage stress up to 200V
• Offers exceptional high frequency performance for FLASH characterization and gigahertz-level ring oscillator measurements.

Services

• Test Structures Design
  - For Process Monitoring
  - Technology Qualifiaction
  - Yield Improvement
  - Quality And Reliability
  ----Ø Eml
  ----Ø TDDB
  ----Ø HCI
  ----Ø Vt
  - ESD
• Test Structures Verification and Testing
• Development of Test Program for Specific Testing